Abstract: Coherent imaging systems employing two identical holographic lenses in a conjugate arrangement have demonstrated significant potential in speckle metrology, as they provide diffraction-limited imaging free from monochromatic aberrations. However, the minimum measurable in-plane displacement (measurement sensitivity) in such systems depends on the f-number of the holographic lenses. Since achieving a low f-number is constrained by the availability of high-quality pinholes only in limited sizes during holographic lens recording, the measurement.....
Keywords: Holographic lenses, In-plane displacement, Speckle metrology, Coherent imaging, Diffractive optical elements
[1]
E. Archbold, J. M. Burch, And A. E. Ennos, "Recording Of In-Plane Surface Displacement By Double-Exposure Speckle Photography," Opt. Acta, Vol. 17, Pp. 883-898, 1970.
[2]
E. Archbold And A. E. Ennos, "Displacement Measurement From Double Exposure Laser Photographs," Opt. Acta, Vol. 19, Pp. 253-271, 1972.
[3]
J. A. Leendertz, "Interferometric Displacement Measurement On Scattering Surfaces Utilizing Speckle Effect," J. Phys. E: Sci. Instrum., Vol. 3, No. 3, P. 214, 1970.[4]
R. S. Sirohi, Introduction To Optical Metrology. Boca Raton, Fl, Usa: Crc Press, Taylor & Francis Group, 2016.
[5]
R. K. Jayaswal, A. A. Khan, And H. L. Yadav, "An Experimental Method To Minimize Errors In The In-Plane Displacement Measurements In Laser Speckle Photography Using A Dual Aperture Compact Hololens Imaging System," Russ. J. Nondestruct. Test., Vol. 61, No. 11, Pp. 859-868, 2025.